News & Events


Paricon Introduces Lock-N-LoadTM Socket Clamps for Optimum Load Adjustibility and Accuracy

 

 

f15lockandload

Paricon's Lock-N-Load sockets were developed in direct response to the stated needs of test and characterization engineers. They needed the low loss of the PariPoser contact system along with maximum adjustability and simplicity of operation. Of course this is needed at a very low price.

Paricon now provides two series of Lock-N-Load sockets; the F14 series which has a standard footprint and the F15 Series which allows easy adapting to most socket footprints.  At the heart of the Lock-N-Load system is an ergonomic clamp and a unique load system. The load system has broad adjustability that allows the user to establish the optimum clamping force for his device. All issues associated with device thickness and other z-axis tolerances are eliminated with this design. The actual applied load is a direct function of the knob rotation after the load member contacts the device. A calibration curve is provided with each socket allowing the user to determine the actual applied load. An example of this is shown below.

 

 

 

 

 

Less than 0.4 db Loss at 40 GHz is Routinely Provided in all Paricon Contactors.

Advanced device and board designs require significant attention to the electrical characteristics of the interconnection structure. The interconnect structure is normally optimized for soldering the device to the board. Testing of the device is done using sockets whose electrical characteristics are poorly matched to the system under test. The socket vendor will provide optimized data that demonstrates that if the device is built to match the socket, the socket will not impeded the test of the device. Unfortunately, this adds one more design constraint and ultimately results in the search for alternative approaches. One of these approaches is to directly press the DUT to the board contacts. This can work but will result in low test yield due to normal flatness variations preventing quality contact. The PariPoser contact system, due to its unique structure, demonstrates very low inductance and a loss of under 0.4 db at 40 GHz. Numerous independent lab studies  have been conducted which validate the performance of the PariPoser contactor. Using these contactors provides performance well matched to the soldered device.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Adaptor Sockets Allow For Easy Conversion to Paricon's High Performance Contactors.

High frequency digital signals need to be interconnected through passive interconnects that have low loss at the 5th harmonic. This means that to properly conduct quality rise times in a digital signal that has a primary component of 10 GHz, the contactor must have low loss at 50 GHz. Few, well marketed, contactors can actually perform well at these frequencies. As a result, the test engineer finds that he has a system that fails to properly demonstrate the capability of the DUT. Paricon has addressed this need by the introduction of the F15 platform which allows an easy upgrade to the PariPoser contact system.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Multi Device Sockets Reduce Cost of Test Hardware

Traditional burn-in methods have one device per socket with many sockets on a board. Today it is possible to have a single socket which can interconnect an entire tray of devices to a single board. This reduces the socket cost, increases the number of test sites per unit area on the board and results in a significant reduction in system hardware cost. Paricon can provide a low profile, custom socket that will meet your advanced needs. Contact sales@paricon-tech.com to discuss your application.  

 

 

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Patented Space Transformer Technology Eliminates Test Board Wear.

A fully qualified test board is a valuable piece of capital equipment. The cost of these boards can be as high as $100,000. Test sockets are the major source of damage to the test board due to the constant scrubbing of the board contact pads by the socket contacts. A low cost interposer and a layer of PariPoser material placed between the socket and test board provides a very cost effective means of protecting the test board without impacting on the electrical interconnection performance. Paricon's studies have shown that after more than two million test cycles there was no pad wear on the test board.


 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Award Winning BGA Contactor Demonstrating Less Than 1 db Loss at 40 GHz.

  Paricon has combined the well known crown contact with the PariPoser contact material creating the shortest known spring contact available to date. The length can be under 0.5 mm and the measured performance demonstrates an insertion loss of 1 dB at 40 GHz. This patented capability is being extended to most of the popular spring contact tip designs. The PariProbe contact structure is available as an option in most of our sockets.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Customer Quote of the Week

"Using the Paricon PariPoser material gives me best performance - similar to a soldered solutions."

This has become an almost routine response from Paricon's customers who are testing devices at multi GHz frequencies. For most applications our contact systems are virtually invisible and allow the ability to test the actual performance of the part without soldering the part to the board. Independent studies support the observations of our customers.